Products

	Products Photothermal systems Based on Photothermal Common-Path Interferometer (PCI) concept The instrument
	Detects the thermal effect of absorption. Insensitive to scattering. Has moderate 3D resolution: test substrate behind the coating, interface between bonded parts make 2D or 3D maps of absorption patterns Can be used to monitor induced, time-dependent absorption: gray tracks, laser-induced transparency (bleaching), initial stages of optical damage, etc.

Industrial Quad systems

Quad industrial systems features


Motorized XYZ scanning unit 1"x1"x1" or 2"x2"x2" (replaces manual version)
Programmatic control of the scanning unit. Automatic 1D/2D/3D sample scanning
Quick-change sample holders for screening tests
2 types of the Quad enclosure: with 1 port for pump lasers or with 2 ports

Choose required photothermal system configuration using System builder tab

Common Quad specifications


Probe laser	Low noise class IIIa He-Ne
Probe wavelength	633 nm
Pump/probe crossing angle	0.1 rad
Pump chopping frequency range	200-800 Hz
Sensitivity to bulk absorption (minimum absorbed pump power per 1cm length)	1 µW*, CW or average
Sensitivity to surface absorption (minimum absorbed pump power)	0.1 µW*, CW or average
Transverse resolution in space	60 µm
Longitudinal resolution in space	0.6 mm*
Resolution in time	from 0.01 sec
Precision for relative measurements of absorption	<5%
Lock-in amplifier type	dual-phase
Nnumber of photodetectors	1

* approximate number (depends on the type of tested optical material)

Other features


Sensitivity of absorption measurements	10^-7
- Low absorption in the bulk optical materials for high power applications such as sapphire, YAG, fused silica, LiNbO3, KTP, TeO2, etc.
Insensitive to scattering
- Photothermal systems detect thermal effect of absorption

Stanford Photo-Thermal Solutions
Tel.: +1 408 353-3943

E-mail: alex.shevchuk@stan-pts.com